Aehr Test Systems announced it has received a new customer order of more than $1 million for multiple ABTS Burn-in and Test Systems from a European semiconductor manufacturer. The order includes down payments to lock in delivery slots and volume pricing discounts. As the order is for a configuration that is shipping in volume today, shipments are expected before the end of Aehr Test's fiscal 2014.

The ABTS systems will be used in the qualification and production of a wide variety of devices, including memories, microcontrollers and microprocessors. Qualification tests typically utilize a high-temperature operating life (HTOL) test, where failure mechanisms are accelerated by burning-in the devices for 1000 hours to confirm that the basic design and fabrication process of a device will meet the reliability targets over an extended period of normal use. Production burn-in is a much shorter stress to ensure that early-life failures are screened out before the devices are shipped to the end customer.