NATIONAL INSTRUMENTS CORPORATION National Instruments Corporation announced the NI PXIe-5162 digitizer and updates to the LabVIEW Jitter Analysis Toolkit. The digitizer, with 10 bits of vertical resolution and a 5 GS/s sample rate, provides high-speed measurements at four times the vertical resolution of a traditional 8-bit oscilloscope. With 1.5 GHz of bandwidth and four channels in a single slot, the NI PXIe-5162 is suited for high-channel-count digitizer systems in manufacturing test, research and device characterization.
Engineers can use the digitizer with LabVIEW and the LabVIEW Jitter Analysis Toolkit, which provides a library of functions optimized for performing the high-throughput jitter, eye diagram and phase noise measurements demanded by automated validation and production test environments. NI PXIe-5162 Features: 10 bits of vertical resolution for greater insight into the signal, Four channels in a single 3U PXI Express slot, expanding to 68 channels in a single PXI chassis, GS/s maximum sample rate on one channel or 1.25 GS/s on four channels simultaneously. LabVIEW Jitter Analysis Toolkit Features: Built-in functions for clock recovery, eye diagram, jitter, level and timing measurements, Example programs for eye diagram and mask testing, and random and deterministic jitter (RJ/DJ) separation using both dual-Dirac and spectrum-based separation methods.
